Çerez Örnek

Energy Dispersive X-ray Fluorescence Spectrometer (XRF

EDXRF (Energy Dispersive X-Ray Fluorescence Spectrometer)

Non-Destructive, Fast, and Precise Elemental Analysis

EDXRF Device Image

Rigaku NEX CG EDXRF device

Description

In the Energy Dispersive X-Ray Fluorescence Spectrometer (EDXRF), photons emitted from an X-ray source are directed onto the sample to be chemically analyzed. When these photons interact with the atoms in the sample and have sufficient kinetic energy, they eject an electron from the inner shell of the atom, bringing it from the ground state to a higher energy state. When an electron from an upper shell fills this vacancy, energy is released and the atom returns to its ground state. The emitted energy is characteristic fluorescence radiation. The wavelengths of these characteristic rays are fixed and specific to each element, enabling the chemical analysis of the sample.

The Energy Dispersive X-Ray Fluorescence Spectrometer is a simple, sensitive, rapid, non-destructive, and cost-effective analytical technique used to determine the elemental composition of various materials such as solids, liquids, powders, thin films, and metals.

Using appropriate standard materials, quantitative analysis can be performed from ppm levels up to percentage levels. With the EDXRF spectrometer, semi-quantitative determination of all elements from Sodium (Na-11) to Uranium (U-92) can be carried out.

Applications

  • Environmental samples
  • Minerals and geological samples
  • Chemical and metallurgical samples
  • Paint industry
  • Precious stone analysis
  • Fuel analysis
  • Food and agricultural products
  • Archaeological samples

Device Hardware and Technical Specifications

Device Name: Rigaku NEX CG

  • X-ray tube: Pd anode, 50W max power, 50 kV max voltage, four standard secondary targets
  • Detector: High-performance SDD
  • Sample chamber: 38 cm diameter × 10 cm depth (for bulk samples), 15-position automatic sample changer (32 mm cups)
  • Spectrometer power supply: Single-phase AC 100/220V, 15/7A (50/60 Hz)
  • Options: Fifth secondary target for optimum Na and Mg excitation, 9-position automatic sample changer with rotation feature
EDXRF X-Ray Fluorescence Elemental Analysis Non-Destructive Analysis

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Ege Üniversitesi

EGE UNIVERSITY