SPM and AFM Microscope

Information About Scanning Probe Microscope Systems

Bruker Dimension Edge AFM/SPM system

Description

Scanning Probe Microscopy (SPM) includes high-resolution imaging techniques such as Scanning Tunneling Microscopy (STM) and Atomic Force Microscopy (AFM). The Bruker Dimension Edge SPM is capable of analyzing conductive, semiconductive, and non-conductive samples in both air and liquid environments.

Differences Between STM and AFM

While STM can only image the surface structure of conductive or semiconductive samples, AFM can also image non-conductive samples and map surface topography with high precision.

Operating Modes

• Contact Mode: The probe tip remains in constant contact with the surface.
• Non-Contact Mode: The probe detects interatomic forces without touching the surface.
• Tapping Mode: The probe intermittently touches the surface in a controlled manner to perform measurements.

Available Analyses

• Surface morphology and topography analyses
• Coating/film thickness measurement
• Surface roughness characterization
• Surface adhesion and phase mapping
• Hardness and elasticity analysis via nanoindentation
• Localized mechanical property mapping
• Electrical conductivity and magnetic field imaging
• Sample examination in liquid environments (e.g., cells)